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Tuesday, August 18th, 2015

At-Line Analysis of Sulfur in Fuels Using ED-XRF Spectroscopy is Detailed in New Application Brief

A new application brief explaining how the use of ED-XRF spectroscopy for at-line analysis of sulfur in fuels can cut production delays from days to minutes is available to download from http://xrf.spectro.com/spectroscout/at-line/analysis-of-sulfur-in-fuels.

Sulfur content is a key quality determinant for many petroleum products and the knowledge of the content of sulfur in fuels impacts processing and assists compliance with government regulations. Traditionally, the analysis of sulfur in fuels has been performed in the laboratory using XRF spectroscopy. However, the practice often results in production delays due to the time required to transport samples from the line to the laboratory as well as the time samples spend waiting in queue in the lab to be processed.

Now, a new generation of portable ED-XRF spectrometers is enabling rapid and accurate at-line analysis — right at the production line — for many applications requiring the detection of sulfur in fuels. According to the new application brief, “At-Line Analysis of Sulfur in Fuels According to ASTM D4294 Using ED-XRF Spectroscopy,” with a portable ED-XRF spectrometer, at-line analysis can be performed once the sample is collected from any process point — and it fully conforms to the ASTM D4294 requirement for analysis time of 1 to 5 min per sample.”

In addition to an introduction and discussion of the need for at-line QC, the new brief discusses the advances and advantages of portable ED-XRF technology for at-line analysis of sulfur in fuels. The brief also documents, in detail, the at-line analysis of a series of samples using a SPECTROSCOUT portable spectrometer equipped with a transmission target X-ray tube (Rh target), a filter changer, a helium purge system and a high resolution large area SDD. The resolution of the SDD used amounted to <155 eV (Mn Kα) at an input count rate of up to 200,000 cps. The results from the tests showed compliance with criteria set out in ASTM D4294.

The brief concludes with helpful guidance for the specification and selection of an at-line ED-XRF system, including factors to consider when comparing ED-XRF spectrometers — and notes the vast differences in instrument performance, ease of use, and suitability for the at-line analysis of sulfur in fuels.

Download the new brief, “At-Line Analysis of Sulfur in Fuels According to ASTM D4294 Using ED-XRF Spectroscopy,” from http://xrf.spectro.com/spectroscout/at-line/analysis-of-sulfur-in-fuels. The brief is authored by SPECTRO Analytical Instruments, a leading global supplier of analytical instruments for optical emission and X-ray fluorescence spectrometry.

About SPECTRO:

SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service.

SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with more than 15,000 colleagues at nearly 150 operating locations and sales and service operations in the United States and 30 other countries around the world.


Tuesday, June 16th, 2015

SPECTRO Introduces SPECTROLAB Spectrometers for Ultimate Performance in Metal Analysis

Kleve, Germany —June 16, 2015 — SPECTRO Analytical Instruments today introduced two new SPECTROLAB Arc/Spark optical emission spectrometers for high-performance metal analysis.

The new SPECTROLAB metal analyzers deliver ultrahigh speed of measurement, ultralow limits of detection, ultimate elemental flexibility, spectacular stability, and affordable cost of ownership to set new standards for elemental analysis in metals industry research and development (R&D) and process/quality control.

The new hybrid SPECTROLAB metal analyzer combines analog photomultiplier tube (PMT) detectors with digital charge coupled device (CCD) technology for ultra-accurate simultaneous measurements in R&D, trace metal measurement, and precious metals analysis.

The new breakthrough all-CCD technology SPECTROLAB spectrometer for metal analysis provides outstanding speed, accuracy, and flexibility for process control and QC of fabricated and finished goods.

Features of both new high-performance metal analyzers include:

  • Spectacular stability without compromise. Unlike conventional models, SPECTROLAB’s sealed, no-purge optical system maximizes light transmission stability, even in the far UV; its software utilizes sophisticated online drift correction measures; and its optimum correlation between analytical and reference lines provides the most stable measurement approach possible.
  • Ultralow limits of detection with improved background correction. Depending on application and analytes, SPECTROLAB can easily ascertain trace values in single parts per million (ppm).
  • Ultrahigh speed of measurement. The coupling of a high-energy plasma generator with SPECTRO’s unique dynamic pre-burn process delivers a lightning fast setup, accelerated sample throughput, and extremely low time to measurement in many applications.
  • Ultimate elemental flexibility, in most cases eliminating hardware reconfigurations. An optional software-extendable configuration enables changes to the elemental setup without requiring calibration.
  • Affordable cost of ownership. iCAL logic saves not only time but also cost for standardization samples. UV-PLUS purification eliminates expensive argon purging or vacuum pumps. Component relocations, advanced diagnostics, and other improvements ease maintenance and prevent downtime.
  • Excellent ease of use with a new user interface and new application profiles that are tailored to predetermined user requirements.

Both new SPECTROLAB high-performance OES spectrometers for metal analysis are immediately available from SPECTRO Analytical Instruments. For more information, visit http://www.spectro.com/lab or email spectro.info@ametek.com.

In addition, join the live webinar broadcast, “Metalmorphosis: Sparking a Revolution in High Performance Metal Analysis” on July 16, 2015, at 1:30 p.m. EDT. Register now at: http://oes.spectro.com/spectrolab/webinar.

SPECTRO Analytical Instruments is a leading global supplier of analytical instruments employing X-ray fluorescence, Arc/Spark, ICP-OES, and ICP-MS technology for the elemental analysis of materials in industry, research, and academia.

About SPECTRO:

SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service.

SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with more than 15,000 colleagues at nearly 150 operating locations and sales and service operations in the United States and 30 other countries around the world.


Tuesday, June 16th, 2015

New Portable SPECTROSCOUT X-ray Fluorescence Spectrometer Delivers Fast Lab-Quality Results for At-Line Elemental Analysis

Kleve, Germany — June 15, 2015 — SPECTRO Analytical Instruments today announced the introduction of the new portable SPECTROSCOUT X-ray fluorescence spectrometer that brings laboratory-quality elemental composition monitoring and quality control testing to at-line analysis.

The durable and compact SPECTROSCOUT XRF analyzer delivers reliable and highly precise results with the power of a top-grade laboratory benchtop instrument in an easily transportable design. The SPECTROSCOUT is ideal for manufacturers and processors of such products as chemicals, cosmetics, feedstocks, foods, metal coatings, and pharmaceuticals among others

Employing the SPECTROSCOUT for at-line analysis dramatically enhances QC productivity by eliminating time spent transporting samples from the plant floor to the laboratory to wait in queue for testing. In contrast, the SPECTROSCOUT can deliver audit-traceable results directly from the manufacturing floor.

Moreover, the SPECTROSCOUT is a much more affordable alternative as an at-line installation than larger and more costly laboratory instruments, and it can be operated with minimal introductory training.

Features of the new portable SPECTROSCOUT X-ray fluorescence include:

  • Dependable accuracy and sensitivity at a wide range of detection levels, providing precise at-line analysis from high-percentage concentrations to trace elements.
  • Performance levels that surpass those of other portable spectrometers at a highly competitive cost that is half that of a dedicated laboratory instrument.
  • Ease-of-operation that includes an intuitive interface, simplified software that interacts via a standard computer, and predefined applications packages.
  • Unique iCAL calibration takes just a single integrated sample and 5 minutes, reducing recalibration work.
  • Laboratory-instrument class advantages, ranging from customer-specific calibrations to advanced pre-calibrated application packages.
  • Rugged, lightweight (12 kg/26.46 lb) space-savings design (350 x 306 x 306 mm/13.8 x 12.1 x 12.1 in), that optionally includes a 5-hour internal battery for plant floor, at-line analysis as well as X-ray fluorescence analysis anywhere from the laboratory to the field.

The portable SPECTROSCOUT X-ray fluorescence spectrometer is immediately available from SPECTRO Analytical Instruments. For more information, including a variety of application notes, visit the SPECTROSCOUT Resource Center on the Web at http://xrf.spectro.com/spectroscout, or email spectro.info@ametek.com.

In addition, join the live webinar broadcast,Get Lab-quality QC analysis right at the point of production – with new SPECTROSCOUT on July 9, 2015, at 11:00 a.m. EDT. Register now at: http://xrf.spectro.com/spectroscout/at-line/webinar.

SPECTRO Analytical Instruments is a leading global supplier of analytical instruments employing X-ray fluorescence, Arc/Spark, ICP-OES, and ICP-MS technology for the elemental analysis of materials in industry, research, and academia.

About SPECTRO:

SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service.

SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with more than 15,000 colleagues at nearly 150 operating locations and sales and service operations in the United States and 30 other countries around the world.


Tuesday, April 7th, 2015

SPECTRO Launches New Service & Support Website for North American Customers

SPECTRO North American Service SupportKleve, Germany — April 7, 2015 — SPECTRO Analytical Instruments has launched a new website consolidating service, training, and application and technical support for the benefit of its North American customers. The website is located at http://representatives.spectro.com/spectro-support-usa.

A member of the AMETEK Materials Analysis Division, SPECTRO is one of the worldwide leading suppliers of analytical instruments, employing optical emission and X-ray fluorescence spectrometry technology, used for the elemental analysis of materials in industry, research and academia.

The new SPECTRO website is designed to provide customers in North America with a full range of service and support options to ensure their SPECTRO instruments are operating to optimal factory specifications — and providing accurate results with as little downtime as possible.

The site is supported through the AMECARE program, which offers a complete suite of programs and products — and certified factory trained technical staff averaging over 15 years of experience per person — in support of SPECTRO customers.

The new website offers information, support and services specific to North America on:

  • Service and Support Contracts ranging from annual preventive maintenance to on-site service visits to keep instruments operating to factory specifications.
  • An Online Shop for the purchase of parts and accessories
  • Training Programs offering instruction on advanced techniques for particular instruments. The courses are offered throughout the year at SPECTRO’s training facility in Mahwah, NJ.
  • AMECARE Performance Services designed to ensure optimum performance and long equipment life. Services include preventive maintenance programs, application solutions, expert consultation, and targeted training classes.
  • Application Specialists who are available for consultation by customers to resolve technical and application issues regarding their particular analysis needs.
  • Technical Support contact information.

For more information, visit the SPECTRO North American Service and Support website at http://representatives.spectro.com/spectro-support-usa.

About SPECTRO:

SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service.

SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with over 15,000 colleagues at more than 120 manufacturing and sales and service operations in the United States and 30 other countries around the world.


Tuesday, March 24th, 2015

AMECARE M2M Service Remotely Monitors SPECTRO ICP Spectrometers to Ensure Integrity, Avoid Downtime

SPECTRO_ARCOSKleve, Germany — March 24, 2015 — SPECTRO Analytical Instruments’ AMECARE M2M service offers the continuous remote monitoring of select SPECTRO ICP spectrometers to proactively ensure their integrity of operation and reduce the risk of downtime. The service is offered in combination with SPECTRO’s AMECARE Preventative Maintenance programs.

SPECTRO ICP spectrometers are equipped with intelligent diagnostic capabilities that report on the integrity of critical system components. With these capabilities, the cause of an instrument breakdown can be isolated and identified to speed system recovery. The technology also provides information for use with preventative intervention.

With the AMECARE M2M (Machine-to-Machine) service, diagnostic information is transmitted from the SPECTRO ICP spectrometer to SPECTRO’s central M2M server, where it is analyzed to proactively identify and flag any potential component maladjustment, degradation, or failure. If an issue is identified, the local SPECTRO service organization is alerted about the situation and the customer is contacted directly — ensuring that potential problems do not go unnoticed and are addressed proactively.

Components monitored by the M2M system include the Plasma Generator (torchbox and sample introduction system); Optical System; ICALization process; Instrument power supplies, readout and other electronic components. Benefits of the continuous monitoring include dramatically reducing the risk of instrument failure and the cost of the resulting downtime — as well as extending the life of the instrument.

User confidentially is ensured throughout the design and operation of the M2M system. The service transmits only instrument hardware and ICAL process relevant information — while analytical methods and analytical results are excluded. The system is unidirectional and secure — other than the communication handshake, information cannot be transmitted to the instrument from the remote M2M server — thus ensuring instrument encapsulation for maximum system integrity.

The AMECARE M2M intelligent diagnostic service is available on the following SPECTRO ICP spectrometers:

  • SPECTRO ARCOS FHE12 / FHS12
  • SPECTRO ARCOS 165 FHE16 / FHS16
  • SPECTRO ARCOS FHE22 / FHS22 / FHM22
  • SPECTRO ARCOS 160 FHE26 / FHS26
  • SPECTROBLUE FME16
  • SPECTROBLUE FMS16
  • SPECTROBLUE FME26
  • SPECTROBLUE FMS26
  • SPECTROBLUE FMT26
  • SPECTRO GENESIS FES17
  • SPECTRO GENESIS FEE17
  • SPECTRO MS MSS01

For more information, visit http://ow.ly/KJNoC or email spectro.info@ametek.com.

About SPECTRO:

SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service.

SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with over 15,000 colleagues at more than 120 manufacturing and sales and service operations in the United States and 30 other countries around the world.


Tuesday, March 3rd, 2015

New SPECTRO xSORT Handheld EDXRF Spectrometers Deliver Reliable On-Site Identification, Elemental Analysis And Screening

spectro_xsort_2015_1_familyKleve, Germany — March 3, 2015 — SPECTRO Analytical Instruments today announced the introduction of the new SPECTRO xSORT family of handheld EDXRF spectrometers for onsite elemental analysis and spectrochemical testing in the plant or in challenging field locations.

Each of the three versions of the SPECTRO xSORT energy dispersive X-ray fluorescence spectrometers delivers repeatable, laboratory-quality results in a matter of seconds and is optimized for fatigue-free on-site measurements. Moreover, the proven field-ready design features simple user-friendly displays and efficient ergonomics to make the devices extremely easy to use.

Each version of the SPECTRO xSORT EDXRF spectrometers is a leader in its class for a broad spectrum of applications:

  • The SPECTRO xSORT Alloy handheld XRF is designed for affordable metals identification and is ideal for the quick incoming inspection of materials. This entry-level model employs an innovative silicon PIN (Si-PIN) detector and delivers grade identification of metals in seconds without extensive analysis.
  • SPECTRO xSORT AlloyPlus is designed for advanced metals analysis and is ideal for use with scrap metals sorting and positive material identification (PMI). Featuring a top-of-the-line silicon drift detector (SDD), the xSORT AlloyPlus provides reliable, high-productivity measurement and analysis. The instrument performs metal grade analysis in only 2 seconds for most alloys, or, in just 10 additional seconds, sorts alloys containing “light” elements, such as magnesium, aluminum, silicon, phosphorous, and sulfur.
  • SPECTRO xSORT NonAlloy for fast element screening is SPECTRO’s handheld XRF with silicon drift detector (SDD). It delivers fast, reliable measurement and elemental analysis of nonmetallic materials with an outstanding level of performance It generates high-productivity spot checks in a few seconds, or hold on the sample longer for laboratory-quality results. The SPECTRO xSORT NonAlloy is ideal for environmental and RoHS compliance screening, as well as for geological exploration.

All three SPECTRO xSORT EDXRF spectrometers offer a host of features from low detection limits down to the ppm range for heavy metals, to an interface bezel with operator-defined hot keys to maximize speed of common tasks, to “live” analysis results, to wireless LAN and more.

SPECTRO xSORT handheld EDXRF spectrometers are immediately available from SPECTRO Analytical Instruments. Download the xSORT handheld XRF brochure at http://www.spectro.com/xsort.

For more information, visit the SPECTRO xSORT handheld XRF website at http://ow.ly/JJZSq or email spectro.info@ametek.com. SPECTRO Analytical Instruments is a leading global supplier of analytical instruments employing XRF, Arc/Spark, ICP-OES, and ICP-MS technology for the elemental analysis of materials in industry, research, and academia.

About SPECTRO:

SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service.

SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with over 15,000 colleagues at more than 120 manufacturing and sales and service operations in the United States and 30 other countries around the world.


Wednesday, February 4th, 2015

New Whitepaper Helps with Selection of ICP-OES Spectrometer’s Plasma Interface: Axial-View, Radial-View, Dual-View or New Multiview

New Whitepaper Helps with Selection of ICP-OES Spectrometer’s Plasma Interface: Axial-View, Radial-View, Dual-View or New Multiview

New Whitepaper Helps with Selection of ICP-OES Spectrometer’s Plasma Interface: Axial-View, Radial-View, Dual-View or New Multiview

Kleve, February 4, 2015— A new whitepaper helps purchasers of new ICP-OESspectrometers through the critical — and complex — process of selecting the best appropriate plasma viewing interface for their intended applications. The paper is available to download from SPECTRO Analytical Instruments at http://goo.gl/VuH6qA.

The new whitepaper, “Selecting Your ICP-OES Analyzer’s Plasma Interface: Axial-View, Radial-View, Dual-View or New MultiView,” recommends that when considering a new ICP-OES analyzer purchase, users should focus their selection of the plasma interface based on the range of their applications and the elements they expect to analyze. Doing so, and understanding the benefits and drawbacks of each available viewing technology — axial-view, radial-view, dual-view, or MultiView — will help determine which is the best fit for their analytical tasks. In the whitepaper, each of the differing plasma viewing technologies are defined, their strengths and weaknesses are highlighted, and examples of typical applications are provided.

The paper also discusses a recent development in plasma viewing techniques — the sequential MultiView technology  — that transcends the various disadvantages of the “dual-view” approach by eliminating the use of added mirrors or periscopes. Instead, the MultiView solution enables the user to simply shift the direction of the plasma torch into a new axial or radial orientation with a relatively simple changeover that takes about 90 seconds. As a result, MultiView offers full axial sensitivity and full radial precision without any dual-view compromises — for the functional equivalent of two dedicated, fully optimized analyzers in one. The new technology is currently available in one version of the new SPECTRO ARCOS analyzer — making the spectrometer the only ICP-OES instrument that offers both axial and radial plasma views, but without bias or compromise.

Download “Selecting Your ICP-OES Analyzer’s Plasma Interface: Axial-View, Radial-View, Dual-View or New MultiView” at http://goo.gl/VuH6qA. The whitepaper is authored by SPECTRO Analytical Instruments, a leading global supplier of analytical instruments for optical emission and X-ray fluorescence spectrometry.

About SPECTRO

SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service. SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with over 15,000 colleagues at more than 120 manufacturing and sales and service operations in the United States and 30 other countries around the world.


Wednesday, January 21st, 2015

New SPECTRO ARCOS High-Resolution ICP-OES Spectrometer for Elemental Analysis Surpasses Performance Limitations

SPECTRO ARCOSKleve — January 21, 2015 — SPECTRO Analytical Instruments today announced its new SPECTRO ARCOS high-resolution ICP-OES spectrometer, the first and only spectrometer featuring the fast and convenient selection of axial plasma or radial plasma observation in a single instrument — without any optical compromise.

Designed for use in the most demanding elemental analysis applications in industry, science, and academia, the new SPECTRO ARCOS easily surpasses the performance limitations of conventional ICP-OES instruments — dramatically improving sensitivity, stability, and precision, while lowering operating costs with the introduction of innovative components, unique capabilities, and optimum flexibility.

The new SPECTRO ARCOS establishes a new ICP-OES performance class for complex analytical tasks — resolving a wide array of inherent problems in traditional spectrometer design — and caps 30 years of SPECTO experience in developing advanced solutions for the elemental analysis of metals, chemicals, petrochemicals and other materials.

Features of the new SPECTRO ARCOS include:

  • Axial or Radial Plasma Observation: SPECTRO’s unique new MultiView capability delivers unmatched performance improvements in accuracy and stability and allows for the fast and convenient selection of axial plasma or radial plasma observation with no optical compromise.
  • ORCA Optical System: The CCD optic system with a Paschen-Runge mount assembly delivers a matchless resolution of 8.5 picometer in the wavelength range from 130 to 340 nm.
  • Innovative Power Generator: A unique new solid-state generator design that provides the highest plasma power available for extreme or quickly changing plasma loads.
  • Elimination of the Need for Purge Gases: SPECTRO’s UV-PLUS sealed optical chamber ends the need for the purging of argon or nitrogen gases — along with the related supplies, maintenance costs, and downtime.
  • No External Cooling System: Air-cooled interface technology and the completely air-cooled generator eliminates the need for an external cooling system — along with the associated, and often substantial, equipment, power, and maintenance costs.

The new-generation SPECTRO ARCOS is available immediately from SPECTRO Analytical Instruments. For more information, visit http://www.spectro.com or email spectro.info@ametek.com. SPECTRO Analytical Instruments is a leading global supplier of analytical instruments employing XRF, Arc/Spark, ICP-OES, and ICP-MS technology for the elemental analysis of materials in industry, research, and academia.

About SPECTRO:

SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service.

SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with over 15,000 colleagues at more than 120 manufacturing and sales and service operations in the United States and 30 other countries around the world.


Friday, December 12th, 2014

Geological Material Analysis with Various Techniques is Subject of Complimentary Webinar for Geoscientists on Dec. 17

Kleve, Germany, December 12, 2014 — Geoscientists are challenged to delve into the deeper layers of geological sample analysis and laboratory sample processing optimization in a complimentary webinar on Wednesday, December 17, 2014.

In the webinar titled, “Geological materials analysis using ICP-OES, EDXRF, and ICP-MS,“ experts will explore the strengths and weaknesses of a full range of XRF instruments such as the handheld xSORT, frequently employed for fast onsite analyses; the uniquely portable SPECTROSCOUT, that brings lab caliber analysis out into the field; and the SPECTRO XEPOS, a powerful laboratory workhorse that is the ideal instrument for fast accurate geological sample analysis.

Because of their high sensitivity and high sample throughput, two other techniques for geological material analysis will also be explored: ICP-OES and ICP-MS. The new SPECTRO-MS for geological applications will be discussed — since with its direct charge semi-conductor detection system, this sector field ICP-MS can capture the entire mass spectrum fully simultaneously.

The complimentary webinar, “Geological materials analysis using ICP-OES, EDXRF, and ICP-MS,” will be offered on Wednesday, Dec. 17, at 11 a.m. EST.

Register for the webinar online at: http://goo.gl/GdlggP.

The webinar will be presented by SPECTRO Analytical Instruments, a leading global supplier of analytical instruments for optical emission and X-ray fluorescence spectrometry.

About SPECTRO:

SPECTRO, a unit of the Materials Analysis Division of AMETEK, Inc., manufactures advanced instruments, develops the best solutions for elemental analysis for a broad range of applications, and provides exemplary customer service.

SPECTRO’s products are known for their superior technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical products with over 15,000 colleagues at more than 120 manufacturing and sales and service operations in the United States and 30 other countries around the world.


Monday, December 1st, 2014

DECTRIS Ltd. Introduces Hybrid Photon Counting (HPC) Detection for use in Medical Imaging Equipment

Phase contrast image - fusion of absorption and dark field images. Thomas Thuering et al, PSI, Switzerland.

Phase contrast image – fusion of absorption and dark field images. Thomas Thuering et al, PSI, Switzerland.

Chicago (USA), December, 1, 2014:DECTRIS Ltd. is introducing its hybrid photon counting (HPC) detection technology to enable the next generation of medical imaging equipment — and transform everything from mammography to computerized tomography (CT).

Until now, X-ray detection in medical imaging has mainly relied on the indirect methods utilized by traditional integrating detectors lacking energy discrimination. Unlike these less sensitive devices, HPC detectors provide direct sensing of every single photon in an X-ray — made possible by innovations including optimized solid-state sensors and CMOS readout ASICs using hybrid pixel technology.

Given these properties alone, HPC should far surpass the performance of older technologies in terms of dose and resolution. Paired with advanced new imaging equipment and analysis algorithms, the additional spectral information will open up a new dimension in specificity.

“Designers and radiologists in the medical imaging world have been anticipating the arrival of detection techniques based on Hybrid Photon Counting — it shall allow best possible image quality and the highest sensitivity at the lowest dose.”, said Willi A. Kalender, Professor at the Institute for Medical Physics in Erlangen, Germany.

[Visit DECTRIS Ltd. at the RSNA 2014 Annual Meeting,
in North Hall B: 8047.]

DECTRIS is the world’s acknowledged leader in HPC detection, having produced more than 6,000 HPC detector modules to date — far more than any other source — for a variety of applications in science and industry. DECTRIS’ unique, pioneering HPC technology delivers:

  • Very high resolution — achieving the best signal-to-noise ratio via a noise-free signal with no dark current
  • Very high data rates — via dedicated ASIC and electronic design
  • Exclusive spectral information — via energy analysis, for simple color imaging
  • Highest (almost perfect) spatial resolution — via direct detection, without scintillators, fiber optics, etc.

As the leader in HPC technology, DECTRIS is ready to work with medical imaging OEMs to help realize such new possibilities as:

  • Highlighting microcalcification in breast tissue — with color images produced by new capabilities for energy analysis
  • Highlighting contrast agents such as iodine in mammography

In addition, tissue differentiation is improved for better-informed diagnosis — with phase-contrast imaging used in combination with HPC.

For more information, visit DECTRIS Ltd. at RSNA 2014 in North Hall B: 8047. Or visit the DECTRIS website at http://medical.dectris.com or call 0041.56.500.2180

About DECTRIS

As the technology leader in X-ray detection, DECTRIS aims to continuously improve measurement quality to enable new findings and innovative results in science, industry, and medicine. DECTRIS X-ray detectors make optimum use of the company’s pioneering hybrid photon counting (HPC) technology. It has transformed basic research at synchrotron light sources, as well as in laboratory and industrial X-ray applications worldwide. For more information, visit http://medical.dectris.com or call 0041.56.500.2180


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